Asylum Cypher ES AFM

An atomic force microscope uses a sharp tip to scan a small area on the surface of a sample. This provides an image of the surface features of the sample. The sample can be no larger than 15 mm in diameter. The maximum scan size is 10 microns x 10 microns and the maximum height is 2.5 microns.

Operational Modes

Contact Mode
Tapping Mode
Fluid imaging
Conducting AFM
AMFM
Lateral Force Microscopy

Contact

Aloke Bera
BRWN 3154
560 Oval Drive
West Lafayette, IN 47907
(765) 496-2216
Email: bera@purdue.edu

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